OpenAlex | Statistical pattern recognition: a review

Statistical pattern recognition: a review

Work

Year: 2000

Type: review

Source: IEEE Transactions on Pattern Analysis and Machine Intelligence

Authors Anil K. Jain, Peter Duin, Jianchang Mao

Institutions Michigan State University, Delft University of Technology, IBM Research - Almaden

Cites: 206

Cited by: 6,726

Related to: 10

FWCI: 24.23

Citation percentile (by year/subfield): 94.74

Topic: Face and Expression Recognition

Subfield: Computer Vision and Pattern Recognition

Field: Computer Science

Domain: Physical Sciences

Sustainable Development Goal Quality education

Open Access status: closed