Scanning force microscopy - With Applications to Electric, Magnetic and Atomic Forces
Work
Year: 1991
Type: article
Abstract: PART ONE: LEVERS AND NOISE 1. Mechanical properties of levers 2. Resonance enhancement 3. Sources of noise PART TWO: SCANNING FORCE MICROSCOPES 4. Tunneling detection systems 5. Capacitance detection ... more
Institutions University of Arizona, Centre National de la Recherche Scientifique, Centre d’Élaboration de Matériaux et d’Études Structurales
Cites: 2
Cited by: 570
Related to: 10
FWCI: 6.699
Citation percentile (by year/subfield): 97.63
Subfield: Atomic and Molecular Physics, and Optics
Field: Physics and Astronomy
Domain: Physical Sciences
Sustainable Development Goal Affordable and clean energy
Open Access status: bronze